Microscopy Objective Lens Metrology
Today’s microscopy systems are pushing the limits of performance and engineering. The advent of digital microscopy and computational processing means that, whether using a manual laboratory microscope or a high-throughput automated platform, instruments are expected (and required) to produce excellent image quality across a large field of view and across a range of wavebands. To understand the performance limits of cutting-edge, high quality optical systems you need high-quality, reliable, and precise metrology systems.
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