On-Demand Webinar | Metrology as a Mindset: Engineering for Success

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Date

March 4, 2026

Achieving world-class image quality is often assumed as a final checkpoint — something evaluated only after a lens system is built. In reality, exceptional image quality is not a single outcome but the result of a disciplined, measurement-driven process that spans design, development, and validation. This Optikos Corporation webinar reframes image quality as an accountable engineering practice, grounded in metrology and informed decision-making from the very beginning.

Many optical and imaging teams face recurring pain points: late-stage surprises that force costly redesigns, subjective or incomplete image quality assessments, and misalignment between design intent and real-world performance. Without reliable, application-relevant measurements, teams are left managing risk reactively rather than designing with confidence.

This webinar explores how integrating metrology into every phase of development enables engineers to predict performance, reduce uncertainty, and deliver imaging systems that meet demanding requirements.

Key topics include:

  • Engineering with the end in mind — using metrology-driven design strategies to connect requirements, models, and measurements early, minimizing downstream surprises.
  • Lessons from real-world lens projects on building confidence through traceable, repeatable measurements that create accountability across teams.

Attendees will leave with a clearer understanding of how measurement transforms image quality from a hopeful result into a reliable, repeatable process.

About this Presenter

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David Biss, Ph.D.

David Biss, Ph.D., is the Senior Manager of Optical Engineering at Optikos Corporation, where he has spent the last 12 years in the engineering services department helping customers and clients solve various complex optical problems and challenges. His work at Optikos includes projects on microscopy, lidar applications, remote sensing, and projection display systems. Biss has more than 20 years of experience in the optics field, holds seven patents, and received his doctorate from the Institute of Optics at the University of Rochester.
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