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Optikos created a custom polarimeter that enabled ultra-precise polarization metrology for semiconductor lithography systems, transforming a one-off solution into a 12+ year production partnership for advanced chip manufacturing.

Optikos rapidly transformed a fragile breadboard DNA/RNA detection concept into 15 reliable, long‑lasting demonstrator units. Using a gated medical‑device development process, multidisciplinary engineering, and strategic partnerships, Optikos delivered a robust optical detection platform that continues to support ongoing R&D years later.

Optikos designed and manufactured a custom wafer overlay imaging module featuring sub‑micron repeatability, metrology‑grade stability, and complete optical and mechanical IP ownership.

Optikos identified and eliminated a critical stray light issue by combining advanced Zemax modeling, precision metrology, and targeted opto‑mechanical redesign—achieving over 10× reduction in unwanted reflections.