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Semiconductor · Wafer Overlay Metrology
Optikos Enables Next‑Generation Wafer‑Overlay Metrology Platform
Optikos designed and manufactured a custom wafer overlay imaging module featuring sub‑micron repeatability, metrology‑grade stability, and complete optical and mechanical IP ownership.
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Optikos OpTest System
Giving Stray Light a Home
Optikos identified and eliminated a critical stray light issue by combining advanced Zemax modeling, precision metrology, and targeted opto‑mechanical redesign—achieving over 10× reduction in unwanted reflections.
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High Volume Lens Assembly
Automation Strategy Cuts Cycle Time by 50% for AR Lens Testing
View/print as a PDF Primary Challenges & Breakthroughs Augmented reality (AR) lens manufacturing faces important testing challenges due to complex multi-parameter validation requirements and sequential testing dependencies. Cycle time constraints create critical bottlenecks for augmented reality optics, with comprehensive performance testing of high-precision AR lenses averaging 3-8 minutes per unit—directly impacting manufacturing throughput, workforce costs, and delivery schedules. A new
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Image
Underwater Lens Design
Introduction to the Project This was a fun project and a pretty unique one too. Our customer was looking to acquire high-resolution imagery underwater, and they’d built some prototypes using a lens you might find in a Nikon or Canon camera and came to us asking if we could create a corrector window for that lens to give us the
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