Imager Testing
Our I-SITE™ based test instrumentation allows us to make many types of measurements on both visible (CMOS, CCD, etc.) and infrared (thermal) imagers as well as system level tests (i.e., lens and imager).
Spectral Bands
- Visible (400-700 nm)
- NIR (700-1,000 nm)
- SWIR (1-2.5 microns)
- MWIR (3-5 microns)
- LWIR (8-12 microns)
Formats
- Analog RS-170 and CCIR
- CameraLink
- GigE
Visible, NIR, and SWIR Imagers
- Modulation Transfer Function (MTF)
- Contrast
- Linearity
- Signal Transfer Function (SiTF)
- Noise Power Spectrum (NPS)
- Root Mean Square Noise (RMS)
- Noise Equivalent Luminance (NEL)
- Minimum Resolvable Contrast (MRC)
- Minimum Detectable Contrast (MDC)
Thermal IR Systems
- Minimum Resolvable Temperature Difference (MRTD)
- Minimum Detectable Temperature Difference (MDTD)
- Noise Equivalent Temperature Difference (NEDT)
