Rising to the Challenge in 2026 at Optikos
Date
February 20, 2026
Author
Daniela Dandes
Time
3 min
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ormance. In this circumstance, Optikos has designed precision electro-optical metrology equipment built for high vacuum environments, meeting NASA’s low outgassing (TML/CVCM) requirements. Our vacuum-compatible offering includes Collimators, Target Generators, Multi-Spectral Light Sources, as well as Black-Body Source for infrared testing. All components use space-flight heritage materials, ensuring their performance in a vacuum environment without any contamination risk to the payload under test.

Impact: Satellite customers can shave months off integration schedules and gain confidence that their optical payloads will maintain performance throughout launch and in orbit operation.
2. In Standardizing Objective Testing of Riflescopes and Red-Dot Sights
For defense customers, the OpTest® and LensCheck™ platforms have been complemented with the ColliMeter™ for Riflescopes, a compact, ready to-go system that performs exacting assessment of riflescope or red-dot sight. The new system reproduces the actual performance a shooter would experience in the field. This device enables repeatable, quantitative verification of parallax among other parameters over the field of view. This fresh approach establishes a common benchmark that manufacturers can adopt industrywide.
Impact: Units that previously relied on subjective tests performed by the operator now receive traceable data, shortening production and acceptance testing from days to minutes and raising confidence that the scopes produced are consistent unit to unit.

3. Hyper-Performing Custom Microscopy – From Lab to Wafer
A historical standout example of the Optikos cross industry innovation is the Teradyne 106 mm f/2 wafer inspection lens[1], originally conceived for semiconductor mask inspection and now repurposed for high NA microscopy. Its ultrafast aperture delivers diffraction limited resolution at submicron scales, enabling high-performing microscopy with a performance that exceeded the technology capabilities of our customer. When paired with the Optikos MTF-verified metrology, chip makers can detect particle contamination, pattern collapse and edge roughness in a single pass. Optikos will continue to expand high-end metrology services for wafer inspection while fully integrating custom made microscope objectives that meet the stringent demands of semiconductor manufacturing, as well as advanced laboratory research.

Impact: As defect margin tolerances shrink dramatically, the Optikos custom microscope objectives give fabs a decisive yield boost tool that integrates directly into existing inspection lines, while researchers gain a versatile, ultra-high resolution instrument for cutting edge experiments.
In 2026 Optikos is on a path to standardize how optical performance is measured, validated and delivered across wildly different, yet important markets. From rugged aerial lenses to riflescope benchmarks that bring repeatability to the battlefield and ultrafast microscopy that safeguards the next generation of chips, the company’s innovations converge on one principle: precision optics, everywhere light goes.
[1] Close‑up Photography. “Optikos Teradyne 106 mm f/2 Inspection Lens.” Close‑up Photography, n.d. https://www.closeupphotography.com/optikos‑teradyne‑106mm‑f2‑lens.
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