Imager Testing

Our I-SITE based test instrumentation allows us to make many types of measurements on both visible (CMOS, CCD, etc.) and infrared (thermal) imagers as well as system level tests (i.e., lens and imager).

Visible Spectrum

  • Modulation Transfer Function (MTF)
  • Contrast
  • Linearity
  • Signal Transfer Function (SiTF)
  • Noise Power Spectrum (NPS)
  • Root Mean Square Noise (RMS)
  • Noise Equivalent Luminance (NEL)
  • Minimum Resolvable Contrast (MRC)
  • Minimum Detectable Contrast (MDC)

Infrared Systems

  • Minimum Resolvable Temperature Difference (MRTD)
  • Minimum Detectable Temperature Difference (MDTD)
  • Noise Equivalent Temperature Difference (NEDT)