Optics Terminology
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- Aberration
- Absorption
- Afocal
- Aliasing
- Analog
- Angle of deflection
- Angle of deviation
- Aperture (clear)
- Aperture (relative)
- Aperture stop
- Array
- Aspheric
- Aspheric lens system
- Astigmatism
- Attenuation
- Audit lens
- Autocollimation
- Autocollimator
- Axial chromatic aberration
- Azimuth
- Back Focal Length
- Background luminance
- Bandwidth
- Beam
- Beam folding mirror
- Beam steering components
- Beam steering mirror
- Blackbody
- Broadband
- C-mount
- Calibration reference
- Charge coupled device (CCD)
- Chief ray
- Chief Ray Angle (CRA)
- Chromatic Aberrations
- Coherence
- Collimated light
- Collimation
- Collimator
- Concentric lens
- Conical lens
- Conjugate points
- Conjugates
- Contrast
- converging lens (also known as convergent lens or convex)
- Cutoff frequency
- Definition
- Deflection
- Depth of field
- Depth of focus
- Detector and relay lens assembly
- Diffraction
- Diffraction limited
- Diopter
- Display
- Distortion
- Divergence
- Edge spread functions
- Effective focal length (EFL)
- Electro-optics
- Emissivity
- Encircled energy function
- Endoscope
- Ensquared energy function
- Entrance pupil
- EROS Scanning Image Analysis Module
- Exit pupil
- Extended source
- F/number
- Far-field region
- Field angle
- Field curvature
- Field of view
- Field slide
- Field stop
- Filter
- Flange focal distance (FFD)
- Focal length (effective)
- Focal length (flange)
- Focal plane
- Focal point
- Forward looking infrared (FLIR)
- Foucault knife-edge test
- Fourier analysis
- Fourier transform
- Germanium
- Image
- Image analyzer
- Image analyzer mount
- Image intensifier
- Imaging Systems Integrated Test Equipment (I-SITE)
- Incoherent light
- Infrared light
- Input device
- Interferometer
- Intraocular lens
- Knife-edge scanner
- Knife-edge scanning
- Lateral chromatic aberration
- Lens
- Line source
- Line spread function (LSF)
- Long-wave infrared (LWIR)
- Metrology
- Micro-optics
- Microbolometer array
- Mid-wave infrared (MWIR)
- Minimum detectable temperature difference (MDTD)
- Minimum resolvable temperature (MRT)
- Minimum resolvable temperature difference (MRTD)
- Modulation
- Modulation transfer function (MTF)
- Motion Control System
- MRC Source Unit
- Near-field region
- Near-infrared (NIR)
- Nodal bench
- Nodal points
- Nodal slide
- Nodal testing
- Noise equivalent temperature difference (NETD)
- Noise power spectrum (NPS)
- Numerical aperture (N.A.)
- Object generator
- Objective lens
- Off-axis paraboloid
- Ophthalmic
- OpTest™ Optical Testing System
- Optical
- Optical axis
- Optical beam steering
- Optical bench
- Optical chopper
- Optical head
- Optical testing
- Optical transfer function
- Optics
- Perfect lens
- Phase transfer function (PTF)
- Photometer
- Photometric
- Photometric
- Photometric camera
- Photonics
- Pixel (picture element)
- Plane
- Point source
- Point Spread Function - (PSF)
- Principal axis
- Principal plane
- Principal point
- Radiometer
- References lens
- Reflection
- Reflective collimator
- Refraction
- Relay lens
- Relay optics
- Resolution
- Resolution target
- Resolving power
- Reticle
- Root mean square noise (RMS)
- Sagittal plane
- Second principal point
- Shack-Hartmann
- Short-wave infrared (SWIR)
- Signal transfer function (SiTF)
- Slit
- Source scanning
- Sources
- Spatial frequency
- Spectral
- Surface Measurement Instrument
- System
- Tangential plane
- Target
- Thermal imaging
- ThermCheck™
- Thermography
- Toric lens
- Transmission
- UUT
- Variable Luminance Source
- Video Pattern Generator
- VideoMTF® Image Analysis Module
- Wavelength
- WavePro™ Wavefront Analyzer
- Xenon arc