I-SITE™ Electro-Optical Testing System
Optikos’ I-SITE™ electro-optical testing system can be used for many different types of measurements in different wavelength regions. Both electronic and optical signals can be evaluated. Measurements characteristic of infrared imaging systems such as minimum resolvable temperature difference (MRTD), minimum detectable temperature difference (MDTD), signal transfer function (SiTF), and noise equivalent temperature difference (NETD) are supported along with their visible analogs.
I-SITE™ Integrated System for Imager Test and Evaluation
Optikos’ advanced software measurement package is the heart of its electro-optical testing system. The I-SITE system is the most flexible test suite commercially available, testing discrete components through complete systems. The I-SITE system is designed to provide measurements at multiple points in the signal processing chain for many types of electro-optical systems. I-SITE software can be expanded to accommodate new measurements and can be upgraded to incorporate additional modules as the user’s system requirements change.
The I-SITE software package is designed specifically for connecting Optikos’s source units, positioning equipment, and other measurement devices to Windows compatible systems. With appropriate hardware, I-SITE software can capture data directly from optical images or video signals to make a range of important measurements on almost any electro-optical system. There are standard I-SITE configurations for testing thermal imagers, CCD cameras, displays, image intensifiers, and array detectors.
Actual measurements performed depend upon the physical measurement device used. There are many options that may be employed; thus there is no single I-SITE setup. Sources, detectors, and intermediate optics may all be configured to your requirements, and several different analysis options are offered.