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The LMI is for rapid measurement of radius of curvature of contact lens surfaces or molds. The SMI provides complete surface mapping and reports a full set of Zernike polynomials. The SMI enables measurement of spheres, aspherics, torics and multi-focal surfaces and offer a comprehensive series of graphical displays including surface topography and interferogram. The SMI utilizes our patented technology allowing for extremely precise measurement of radius of curvature. The Centrac utilizes our SMI technology in a bench top package for rapid measurement of small optics.
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Home | About | Products | Services | News | Clients | Careers | Contact | Sitemap © 1995-2007 Optikos Corporation. All information contained herein is the property of Optikos Corporation and cannot be reproduced, in whole or in part, without its written consent. VideoMTF® Image Analysis Module and Optikos Corporation® are registered trademarks of Optikos Corporation. I-SITE, OpTest and EROS are trademarks of Optikos Corporation. Other product and company names may be trademarks and/or registered trademarks of their respective companies. The VideoMTF® Image Analysis Module is protected under U.S. Patent number 5,661,816; the LMI Family of Instruments under U. S. Patent Numbers 5,280,336 and 5,416,574; and patents are pending on the SMI Family of Instruments. |